Journal
MATERIALS
Volume 14, Issue 20, Pages -Publisher
MDPI
DOI: 10.3390/ma14205909
Keywords
nitridation; GaN/n & ndash;GaAs & nbsp; ; Schottky diode; I-V-T; conduction mechanisms; barrier height
Categories
Funding
- University of Cadiz
- regional government Junta de Andalucia [PAI FQM335]
- Spanish Ministry of Science and Innovation [EQC2018-004704-P FEDER 2014-2020]
Ask authors/readers for more resources
Au/0.8 nm-GaN/n-GaAs Schottky diodes show good electrical characteristics, with the disadvantage of nitridation treatment causing an inhomogeneous barrier height.
Au/0.8 nm-GaN/n-GaAs Schottky diodes were manufactured and electrically characterized over a wide temperature range. As a result, the reverse current I-inv increments from 1 x 10(-7) A at 80 K to about 1 x 10(-5) A at 420 K. The ideality factor n shows low values, decreasing from 2 at 80 K to 1.01 at 420 K. The barrier height q phi(b) grows abnormally from 0.46 eV at 80 K to 0.83 eV at 420 K. The tunnel mechanism TFE effect is the responsible for the q phi(b) behavior. The series resistance R-s is very low, decreasing from 13.80 & OHM; at 80 K to 4.26 & OHM; at 420 K. These good results are due to the good quality of the interface treated by the nitridation process. However, the disadvantage of the nitridation treatment is the fact that the GaN thin layer causes an inhomogeneous barrier height.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available