4.5 Article

Identification of kissing defects in adhesive bonds using infrared thermography

Journal

INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES
Volume 64, Issue -, Pages 168-178

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.ijadhadh.2015.10.018

Keywords

Non-destructive testing; Thermal analysis; Composites; Kissing defects; Pulse phase thermography

Funding

  1. Lloyd's Register Foundation, United Kingdom
  2. EPSRC, United Kingdom

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A carbon fibre reinforced plastic (CFRP) adhesively bonded single lap joint sample is used for comparing the detection of different defect types using pulsed phase thermography (PPT). Firstly, a polytetrafluoroethene (PTFE) insert, of the type widely used to simulate defects in composite materials, was added to the bond line of the joint. Liquid layer kissing defects were simulated using silicon grease. PPT clearly identified the PTFE but not the silicon grease contamination. The PPT identified the silicon grease defect when the joint was loaded. It is postulated that kissing defects can be detected using thermography if a small load is applied to the joint, as loading opens the defect and produces a gap that provides sufficient thermal contrast for detection. Thermoelastic stress analysis (TSA) is used to validate the approach. On-site application is addressed both in terms of the load application and the use of low cost infrared (IR) detectors. (C) 2015 Elsevier Ltd. All rights reserved.

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