Journal
SOLID STATE COMMUNICATIONS
Volume 341, Issue -, Pages -Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ssc.2021.114573
Keywords
Diffuse reflectance; Kubelka-Munk model; Tauc plot; Band gap energy
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The authors demonstrate how to use the K-M function and apply it to determine the E-g of TiO2 semiconductor powder, highlighting drawbacks and misconceptions in the procedure of E-g determination from the K-M theory and DRS data, emphasizing that directly determining E-g from the K-M function is inadequate.
The determination of the optical band gap energy (E-g) is important for optimization of the generation of electron/hole pairs in semiconductor materials under illumination. For this purpose, the classical theory proposed by Kubelka and Munk (K-M) has been largely employed for the study of amorphous and polycrystalline materials. In this paper, the authors demonstrate, step by step, how to use the K-M function and apply it thoroughly to the determination of the E-g of TiO2 semiconductor powder (pressed at different thicknesses) from diffuse reflectance spectroscopy (DRS) measurements. For the sample thicknesses 1-4 mm, E-g values of 3.12-3.14 eV were obtained. With this work it is envisaged a clarification to the procedure of determination of the E-g from the K-M theory and DRS data, since some drawbacks, and misconceptions have been identified in the recent literature. In particular, the widely used practice of determining the E-g of a material directly from the K-M function is found to be inadequate.
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