A simple and effective attachment to prevent dome diffraction reaching 2D or 1D detectors in x-ray diffractometers

An attachment has been developed for x-ray diffractometer systems equipped with a domed stage when using a 2D or 1D detector. It consists of a single screen in front of the detector positioned such that it blocks diffraction from the dome. This results in measured data free of disturbing spurious peaks and background, thereby greatly facilitating further data analysis. Its working principle is universally applicable and allows for all specimen orientation movements needed for x-ray diffraction measurements, including texture, stress, and mapping. Published under an exclusive license by AIP Publishing.

Automated summary

The attachment developed for x-ray diffractometer systems equipped with a domed stage provides measured data free of disturbing spurious peaks and background, greatly facilitating further data analysis. Its universally applicable working principle allows for all specimen orientation movements needed for x-ray diffraction measurements, including texture, stress, and mapping.