4.8 Article

Superresolution Linear Optical Imaging in the Far Field

Journal

PHYSICAL REVIEW LETTERS
Volume 127, Issue 25, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.127.253602

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The resolution of optical imaging devices is limited by the diffraction of light. Superresolution microscopy techniques exploit optical nonlinearities, nonclassical properties of the illumination beam, or near field probing for active interaction with the object. A new technique based on passive analysis of light from the object using spatial modes has been demonstrated for 2D imaging with twofold resolution enhancement.
The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modem superresolution microscopy techniques employ active interaction with the object by exploiting its optical nonlinearities, nonclassical properties of the illumination beam, or near field probing. Thus, they are not applicable whenever such interaction is not possible, for example, in astronomy or noninvasive biological imaging. Far field, linear optical superresolution techniques based on passive analysis of light coming from the object would cover these gaps. In this Letter, we present the first proof-of-principle demonstration of such a technique for 2D imaging. It works by accessing information about spatial correlations of the image optical field and, hence, about the object itself via measuring projections onto Hermite-Gaussian transverse spatial modes. With a basis of 21 spatial modes in both transverse dimensions, we perform two-dimensional imaging with twofold resolution enhancement beyond the diffraction limit.

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