Journal
NANO LETTERS
Volume 21, Issue 21, Pages 9262-9269Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.1c03180
Keywords
ReRAM; pi-conjugated molecule; conductive filament location; spatial mapping; finite element modeling
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Funding
- A*STAR AME IAF-ICP [I1801E0030]
- Ministry of Education (MOE) under AcRF Tier 2 grants [2019-T2-2-106, 2019-T2-2-066]
- National Robotics Programme [W1925d0106]
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This study demonstrates a novel method using a pi-conjugated molecule to locate conductive filaments, as well as inducing and observing customized patterns of CFs. Additionally, statistical studies on filaments distribution were conducted to enhance understanding of switching behavior and variability at device level.
Conductive filaments (CFs) play a critical role in the mechanism of resistive random-access memory (ReRAM) devices. However, in situ detection and visualization of the precise location of CFs are still key challenges. We demonstrate for the first time the use of a pi-conjugated molecule which can transform between its twisted and planar states upon localized Joule heating generated within filament regions, thus reflecting the locations of the underlying CFs. Customized patterns of CFs were induced and observed by the pi-conjugated molecule layer, which confirmed the hypothesis. Additionally, statistical studies on filaments distribution were conducted to study the effect of device sizes and bottom electrode heights, which serves to enhance the understanding of switching behavior and their variability at device level. Therefore, this approach has great potential in aiding the development of ReRAM technology.
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