4.5 Article

Standardizing Spatial Reconstruction Parameters for the Atom Probe Analysis of Common Minerals

Journal

MICROSCOPY AND MICROANALYSIS
Volume 28, Issue 4, Pages 1221-1230

Publisher

OXFORD UNIV PRESS
DOI: 10.1017/S1431927621013714

Keywords

atom probe microscopy; correlative microscopy; mineralogy; nanoscale

Funding

  1. Curtin University's Microscopy & Microanalysis Facility
  2. John de Laeter Centre
  3. Australian Research Council [DE190101307, DP210102625, LE190100176]
  4. Australian Research Council [LE190100176, DE190101307] Funding Source: Australian Research Council

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Well-defined reconstruction parameters are crucial for quantifying nanoscale features in atom probe tomography datasets. Testing various approaches, it was found that constraint length measurement of evaporated material provides more consistent results than tip radius measurement. Standardized parameters can alleviate potential problems in measuring nanoscale features caused by inappropriate parameters.
Well-defined reconstruction parameters are essential to quantify the size, shape, and distribution of nanoscale features in atom probe tomography (APT) datasets. However, the reconstruction parameters of many minerals are difficult to estimate because intrinsic spatial markers, such as crystallographic planes, are not usually present within the datasets themselves. Using transmission and/or scanning electron microscopy imaging of needle-shaped specimens before and after atom probe analysis, we test various approaches to provide best-fit reconstruction parameters for voltage-based APT reconstructions. The results demonstrate that the length measurement of evaporated material, constrained by overlaying pre- and post-analysis images, yields more consistent reconstruction parameters than the measurement of final tip radius. Using this approach, we provide standardized parameters that may be used in APT reconstructions of 11 minerals. The adoption of standardized reconstruction parameters by the geoscience APT community will alleviate potential problems in the measurement of nanoscale features (e.g., clusters and interfaces) caused by the use of inappropriate parameters.

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