4.5 Article

Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching

Journal

MICROSCOPY AND MICROANALYSIS
Volume 28, Issue 2, Pages 390-403

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927622000101

Keywords

automated crystal orientation mapping (ACOM); four-dimensional scanning transmission electron microscopy (4D-STEM); nanobeam electron diffraction (NBED); open-source software; scanning electron nanodiffraction (SEND)

Funding

  1. U.S. Department of Energy Early Career Research Award
  2. National Science Foundation under STROBE Grant [DMR 1548924]
  3. Toyota Research Institute
  4. 4D Data Distillery project - U.S. Department of Energy
  5. Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy [DE-AC02-05CH11231]
  6. National Energy Research Scientific Computing Center (NERSC), a U.S. Department of Energy Office of Science User Facility [DE-AC02-05CH11231]

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This article introduces an automated crystal orientation mapping method, which determines the orientation of crystals by collecting diffraction patterns from multiple locations of a complex sample. The speed and accuracy of this method are demonstrated through simulations and experimental data. The method and code are freely available as open source.
Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We have developed an automated crystal orientation mapping (ACOM) procedure which uses a converged electron probe to collect diffraction patterns from multiple locations across a complex sample. We provide an algorithm to determine the orientation of each diffraction pattern based on a fast sparse correlation method. We demonstrate the speed and accuracy of our method by indexing diffraction patterns generated using both kinematical and dynamical simulations. We have also measured orientation maps from an experimental dataset consisting of a complex polycrystalline twisted helical AuAgPd nanowire. From these maps we identify twin planes between adjacent grains, which may be responsible for the twisted helical structure. All of our methods are made freely available as open source code, including tutorials which can be easily adapted to perform ACOM measurements on diffraction pattern datasets.

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