4.7 Article

A robust instance segmentation framework for underground sewer defect detection

Journal

MEASUREMENT
Volume 190, Issue -, Pages -

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.measurement.2022.110727

Keywords

Deep learning; Defect inspection; Underground sewer; Instance segmentation

Funding

  1. Basic Science Research Program through the National Research Foundation of Korea (NRF) - Ministry of Education [2020R1A6A1A03038540]
  2. National Research Foundation of Korea (NRF) - Korea government, Ministry of Science and ICT (MSIT) [2021R1F1A1046339]

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This paper introduces an automatic instance segmentation-based defect analysis framework, which addresses the issues of blurriness and vaporous environment in traditional sewer defect inspection approaches. It presents a novel defect segmentation model and a publicly available dataset. Experimental results demonstrate a significant improvement in mean Average Precision.
The inspection of underground sewer defects plays a considerable role in estimating the structural integrity and avoiding various unforeseen functional failures. However, the conventional sewer defect inspection approaches suffer from the blurry and vaporous environment inside the sewer pipes, which significantly lowers the performance. Besides, it is challenging to achieve efficient and accurate condition assessment by the common manual inspection. Therefore, this manuscript introduces an automatic instance segmentation-based defect analysis framework. The main contributions include 1) a novel defect segmentation model called Pipe-SOLO is firstly presented to segment six common types of defects at the instance level by proposing an efficient backbone structure (Res2Net-Mish-BN-101) and designing an enhanced BiFPN (EBiFPN), 2) a GAN-based dehazing model is applied to effectively solve the image blurring problem, and 3) a publicly available sewer defect segmentation dataset. The experimental results show the proposed Pipe-SOLO achieved an improvement of 7.3% compared with the state-of-the-art method in terms of the mean Average Precision (mAP). Therefore, the proposed defect segmentation method is promising to be integrated with real-life applications that require defect localization and estimation.

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