Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 832, Issue -, Pages -Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2021.142450
Keywords
X-ray line profile analysis; Diffraction peak breadth; Dislocation density
Categories
Funding
- Ministry of Human Capacities of Hungary within the ELTE University Excellence program [1783-3/2018/FEKUTSRAT]
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This commentary points out potential issues with the methodology used in a study for determining dislocation density from X-ray diffraction peak breadth, cautioning against relying solely on values obtained from diffraction profiles.
This is a comment on the paper Materials Science & Engineering A 826 (2021) 141960 titled Influence of prior deformation temperature on strain induced martensite formation and its effect on the tensile strengthening behaviour of type 304 SS studied by XRDLPA. It is shown here that the methodology used for the determination of the dislocation density from the X-ray diffraction peak breadth was not correct. This study reveals that the dislocation density obtained from the breadth of the diffraction profiles may significantly deviate from the reliable values determined by pattern fitting method.
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