Journal
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
Volume 38, Issue 12, Pages 1752-1765Publisher
OPTICAL SOC AMER
DOI: 10.1364/JOSAA.435617
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- Air Force Materiel Command [FA8650-18-C-5023]
- New Mexico Economic Development Department
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In this study, the polarized reflectivity of ideally smooth metals with a uniaxial anisotropic complex refractive index is derived and applied to imaging the orientation of metals. By comparing orientation images obtained through a polarized-light microscope with those obtained through electron backscatter diffraction, the accuracy of c axis orientation images of several titanium alloys is verified to be better than 11%.
The polarized reflectivity of an ideally smooth metal with a uniaxial anisotropic complex refractive index, for instance, metals with hexagonally close-packed (HCP) symmetry, is derived from the electromagnetic wave equation for normal incidence and arbitrary crystal orientation. The resulting orientation-dependent Mueller matrices of the surface are applicable to c axis orientation imaging of metals including beryllium, magnesium, titanium, cobalt, zinc, zirconium, tin, and most of their alloys, as well as other uniaxial compounds. Comparing orientation images recorded with a generalized polarized-light microscope (PLM), in this case an original coherent laser PLM, with orientation images obtained by electron backscatter diffraction (EBSD) enables imaging ellipsometry (IE) at near-normal incidence and increases confidence in ellipsometric refractive-index measurements. In this initial study, without modeling oxides, the resulting c axis orientation images of several titanium alloys are still verified to better than 11% against EBSD maps of the same samples over instantaneous fields of view (FOVs) exceeding 1 cm2 and FOVs approaching 1 in2 obtained by stitching several such images together. (c) 2021 Optical Society of America
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