4.5 Article

A Monolithic Micromachined Thermocouple Probe With Electroplating Nickel for Micro-LED Inspection

Journal

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Volume 30, Issue 6, Pages 864-875

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JMEMS.2021.3112769

Keywords

Bulk micromachining; micro-LED inspection; Ni electroplating; Seebeck effect; thermocouple probe

Funding

  1. Ministry of Science and Technology of Taiwan [MOST 109-2221-E-035-029]

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This study introduces a pair of trapezoid microcantilever probes for inspecting the electrical and thermal properties of Micro-LED, with one designed for electrical conduction and the other for temperature sensing. Experimental results show that the probes can accurately contact the Micro-LED electrodes with good elastic deflection, and the thermal characteristics of a commercial mm-sized LED have been further confirmed and calibrated. The electrical and thermal properties of a square Micro-LED chip have been successfully determined based on the measurement results, with the measured chip temperature at 52 degrees C under an applied current of 100 mu A.
This paper presents a pair of trapezoid microcantilever probes with a monolithic micromachined thermocouple for inspecting the electrical and thermal properties of Micro-LED. To meet testing requirements, one of the microcantilevers was designed as a single-layer Ni structure for electrical conduction, while the other one, which consists of n-type poly-Si, SiO2 and Ni layers, was used for temperature sensing. Both microcantilevers were fabricated by using Si bulk micromachining, thin film deposition, and electroplating processes. Fabrication result shows the length of each probe is about 78 mu m and 118 mu m, and the thicknesses of the microcantilevers and probe tip are 7.2 mu m and 5.5 mu m. Experiment results depict that the thermocouple junction between Ni layer and poly-Si achieves a good ohmic contact, and the measured sheet resistances for poly-Si and electroplated Ni are 150 Omega/sq and 0.01 Omega/sq. This suggests that the induced thermoelectric voltage can be generated and detected in response to a temperature difference. Mechanical tests verified that the probes provide an available elastic deflection to guarantee that the probe tips can exactly contact the Micro-LED electrodes, with a low contact force. The thermoelectric characteristics of the device have been further confirmed and calibrated on the basis of the measurement results of a commercial mm-sized LED in cooperation with an infrared camera. For the subject of the Micro-LED chip with a square size of 75 mu m, its electrical and thermal properties were successfully determined, as the measured chip temperature is 52 degrees C at the applied current of 100 mu A.

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