Superconductivity in amorphous RexZr (x≈6) thin films

We report the growth, characterization and superconducting properties of thin films of a new amorphous superconductor, RexZr ( x asymptotic to 6). Films were grown by pulsed laser deposition with the substrate kept at room temperature. Films with thicknesses larger than 40 nm showed a superconducting transition temperature (Tc) of 5.9 K. Superconducting properties were measured for films with varying thickness from 120 to 3 nm. The normal state resistance scaled linearly with the inverse of thickness. The transition temperature, critical field, coherence length, penetration depth and superconducting energy gap changed marginally with decreasing film thickness down to 8 nm. Scanning tunneling spectroscopy and penetration depth measurements provide evidence for a single gap strong coupling s-wave superconductor. (c) 2021 Elsevier B.V. All rights reserved.

Automated summary

This study presents the growth, characterization, and superconducting properties of a new amorphous superconductor, RexZr (x approaching 6), in thin films. It was found that films with thickness greater than 40 nm exhibited a superconducting transition temperature of 5.9 K, with marginal changes in superconducting properties as the film thickness decreased to 8 nm. Scanning tunneling spectroscopy and penetration depth measurements supported the evidence for a single-gap strong coupling s-wave superconductor.