Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 61, Issue SC, Pages -Publisher
IOP Publishing Ltd
DOI: 10.35848/1347-4065/ac3fca
Keywords
GeOI; ELO; 111; Ge
Categories
Funding
- JSPS KAKENHI [JP17H06148]
- Ministry of Science and Technology in Taiwan [MOST 110-2112-M-002-036, 109-2923-M-002-001, 109-2622-8-002-003]
Ask authors/readers for more resources
In this study, Germanium-on-insulator (GeOI) structures with a surface orientation of (111) were successfully fabricated using low thermal budget epitaxial-lift-off (ELO) technology. The material characteristics and transport properties of the Ge(111)OI structure were systematically investigated. The results indicate the potential of low thermal budget ELO technology for integrating Ge channels with different surface orientations.
Germanium-on-insulator (GeOI) structures with a surface orientation of (111) have been successfully fabricated by using low thermal budget epitaxial-lift-off (ELO) technology via direct bonding and selective etching. The material characteristics and transport properties of the Ge(111)OI structure have been systematically investigated through secondary-ion mass spectrometry, Raman spectroscopy, X-ray diffraction, high-resolution transmission electron microscope, and Hall measurement. The transferred Ge (111) layer remained almost intact from the as-grown epitaxial layers, indicating the benefits of ELO technology. The low thermal budget ELO technology demonstrated in this work is promising to integrate Ge channels with different surface orientations on Si (100) substrates for future monolithic 3D applications.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available