Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 68, Issue 12, Pages 2794-2800Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2021.3128542
Keywords
Beam monitor; heavy-ion accelerator; particle detector; silicon pixel sensor
Funding
- National Natural Science Foundation of China [U2032209, 11875304, 11975292, 12005276, 12005278, 12005279, U1831206, 11927901]
- Strategic Priority Research Program of Chinese Academy of Sciences [XDB34000000]
- CAS Pioneer Hundred Talent Program
- West Light Program
- National Key Research and Development Program of China [2020YFE0202002]
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Particle tracking systems are crucial for the HIAF complex, and the Topmetal-M pixel sensor shows promising performance in research. Both laser and heavy-ion beam tests demonstrate the system's high spatial resolution capabilities.
Particle tracking systems, which function either as particle detectors or beam monitors, are the critical elements for the high-intensity heavy-ion accelerator facility (HIAF) complex. The novel Topmetal-M pixel sensor, which combines the features of both monolithic active pixel sensor (MAPS) and the Topmetal sensor, can be used either for a pixel detector or a nondestructive beam monitor. The Topmetal got its name as some part of the pixel's top metal layer is exposed to sense the drifting charge. In this article, a prototype particle tracking system, named Hi'Beam-S, has been designed to characterize the Topmetal-M sensor. The laser test shows a spatial resolution of similar to 9 mu m for the laser spot measurement. The heavy-ion beam test demonstrates that, for a 5-mm track with a similar to 20 degrees incident angle, a spatial resolution of similar to 1.59 mu m could be achieved.
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