4.5 Article

A Correction Factor to the Two-Bias Method for Determining Mobility-Lifetime Products in Pixelated Detectors

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 63, Issue 3, Pages 1832-1838

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2016.2548420

Keywords

Direct measurement of mu(e)tau(e); two-bias method; weighting potential correction

Funding

  1. DHS DNDO (SBIR) through RMD [HSHQDC-13-C-00068]
  2. DOE through LLNL [DE-AC52-07NA27344]
  3. National Science Foundation Graduate Research Fellowship

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The two-bias method typically used to calculate the mobility-lifetime product (mu tau) in single-polarity charge sensing detectors, uses induced signals from cathode-side events to measure the mu tau. This method assumes an ideal weighting potential (exactly zero through the bulk and a rapid rise to unity at the anode). When a non-ideal weighting potential (e.g., from a pixelated detector) is used, the mu tau is systematically overestimated. In this work, we characterize this overestimation and present a simple correction factor k that can be applied to pixelated electrode configurations. It was found that the correction factor is only dependent on the pixel-pitch to detector thickness ratio.

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