Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 65, Issue 6, Pages 1435-1442Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2016.2518880
Keywords
Factorial hidden Markov model (FHMM); noise analysis; noise measurement; random telegraph noise (RTN); trap spectroscopy
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In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN) in electronic devices. Starting from an in-depth understanding of RTN signal characteristics, we will identify the correct measurement conditions to enable RTN analysis as a characterization tool for electronic devices. The estimate of RTN statistical parameters may indeed strongly depend on the choice of measurement conditions. We will carefully consider both the measurement limits and the extraction process constraints to devise a strategy to identify RTN signals measured in conditions allowing a meaningful estimation of their parameters. The proposed strategy will be tested on a variety of different RTN signals and operating conditions.
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