Journal
COMPUTER METHODS IN APPLIED MECHANICS AND ENGINEERING
Volume 388, Issue -, Pages -Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.cma.2021.114219
Keywords
MPS method; Free surface; High order schemes; Error accumulation; Stability; Biased particle distribution
Funding
- JSPS, Japan KAKENHI [19 K15478]
- MEXT Quantum Leap Flagship Program (MEXT Q-LEAP) , Japan [JPMXS0118067246]
Ask authors/readers for more resources
This study investigates the instability issue at a free surface in semi-implicit particle methods using consistent schemes based on variable differences. A semi-analytical error-analysis method is proposed to clarify how biased neighbor support triggers error accumulation and instability. New free-surface-detection conditions are proposed to reduce error accumulation and improve simulation stability.
This study investigates the instability issue at a free surface when the consistent schemes based on variable differences are applied in semi-implicit particle methods. A semi-analytical error-analysis method is proposed to clarify how the incomplete/biased neighbor support triggers error accumulation and instability. Specifically, the discretization models are decomposed into the center-variable components (CVCs) and neighbor-variable components (NVCs). The influence of different components on error accumulation is analyzed theoretically and numerically. Based on the error analysis, new indices are proposed to evaluate the risk of error accumulation due to the biased neighbor support. Then, novel free-surface-detection conditions are proposed from the indices by detecting the particles prone to error accumulation as free surface particles. Numerical examples demonstrated that the proposed conditions detected fewer free-surface particles but produced more stable simulations compared to the existing conditions. (C) 2021 The Author(s). Published by Elsevier B.V.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available