Degradation of a REBCO Coil Due to Cleavage and Peeling Originating From an Electromagnetic Force

This paper presents the results of a high field generation test for layer-wound HTS coils in a background magnetic field. The test revealed new types of degradation for a REBCO coil caused by an electromagnetic force. A series-connected REBCO coil and a Bi-2223 coil were charged at 4.2 K in a background magnetic field of 17.2 T to generate a central magnetic field of 28.2 T (nuclear-magnetic-resonace frequency of 1.2 GHz). However, a premature normal voltage appeared on the REBCO coil, and the charging was stopped at 25 T. Unwinding the REBCO coil after the experiment found: 1) delamination, due to a cleavage and peeling, of the conductor in a soldered joint inside the winding; and 2) axial movement and edgewise bend deformation of the REBCO conductor at the outermost layer. The keyword of the present degradation is stress concentration, which is also the origin of the more widely known thermal stress-induced degradation.