Journal
CHINESE JOURNAL OF POLYMER SCIENCE
Volume 40, Issue 4, Pages 421-430Publisher
SPRINGER
DOI: 10.1007/s10118-022-2682-8
Keywords
Polymer blends; Interfacial thickness; Atomic force microscopy; Nano-probing; Surface roughness
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Funding
- National Natural Science Foundation of China [51973193]
- State Key Laboratory of Chemical Engineering
- (SKL-ChE-13D)
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This study explores and optimizes a new atomic force microscopy (AFM) system to quantitatively measure the interfacial thickness of immiscible polymer blends, and proposes optimal sample surface preparation procedures.
Immiscible polymer blends are an important family of polymer materials. The interfacial thickness between different phases is a very important parameter that dictates, to a great extent, the morphology and properties of such a blend. This work explores and optimizes an up-to-date atomic force microscopy (AFM) of type NanoIR2 (TM) system in order to quantitatively measure the interfacial thickness of immiscible polymer blends. This system is equipped with two nano-probes capable of detecting the response of a material to an infrared pulse called AFM-infrared spectroscopy mode (AFM-IR) or conducting resonance called AFM-Lorentz Contact Resonance mode (AFM-LCR), respectively. Its potential for quantitatively measuring the interfacial thickness of immiscible polymer blends is evaluated using blends composed of polyamide 6 (PA6) and polyolefin elastomer (POE) in the presence or absence of a POE containing maleic anhydride (POE-g-MAH) as a compatibilizer. Surface roughness affects adversely the signal intensity and consequently an accurate measurement of the interfacial thickness. Optimum sample surface preparation procedures are proposed.
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