Structural, optical, electrical and dielectric properties of (Sr1-xMgx) (Sn0.5Ti0.5)O3 (X=0.00, 0.25, 0.50, 0.75) ceramics via solid state route

We have prepared (Sr1-xMgx)(Sn0.5Ti0.5)O3, (X = 0.00, 0.25, 0.50, 0.75) samples by the solid state reaction method and studied the structural, optical, electrical modulus and the other dielectric properties of the samples with respect to variation in frequencies (1 x 109 to 2 x 109 Hz) using Impedance Analyzer. This study suggests that the XRD patterns of the samples have shown that this possesses cubic perovskite structure in space group Pm-3m and scanning electron microscope was used to analyze the grain size distribution and porosity of the ceramic. The dielectric properties of these materials were strongly dependent upon on concentration X as well as amount of frequencies. The existence of metal oxygen bonds of Sr-Ti-O was verified by Fourier Transform Infra Red (FTIR) spectrum at 540 cm-1. The highest PL intensity of 716.38 that exhibits the green emission (508.5 nm) was obtained for the composition of (Sr0.25Mg0.75)(Sn0.5Ti0.5)O3. AC conductivity slowly decreases with increasing Mg substitution and also the sample (Sr0.25Mg0.75)(Sn0.5Ti0.5)O3 having the lowest (constant) value of conductivity at 1 GHz-2GHz.

Automated summary

In this study, (Sr1-xMgx)(Sn0.5Ti0.5)O3 samples were prepared by the solid state reaction method and their structural, optical, electrical modulus, and other dielectric properties were studied. The XRD patterns indicated a cubic perovskite structure, while SEM was used to analyze grain size distribution and porosity. The dielectric properties were found to be influenced by the concentration X and frequency ranges.