4.5 Article

Mid-Infrared Silicon-on-Insulator Fourier-Transform Spectrometer Chip

Journal

IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 28, Issue 4, Pages 528-531

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2015.2496729

Keywords

Silicon photonics; spectroscopy; infrared

Funding

  1. Engineering and Physical Sciences Research Council through MIGRATION project [EP/L01162X/1]
  2. Spanish Ministry of Economy [TEC2012-37958-C02-02, TEC2012-37958-C02-01]
  3. Community of Madrid [S2013/MIT-2790]
  4. European Association of National Metrology Institutes through European Metrology Research Programme Project [JRP IND14 FREQUENCY]
  5. European Association of National Metrology Institutes through PhotInd Project [JRP-i22 IND22]
  6. Royal Society through University Research Fellowship
  7. EPSRC [EP/L01162X/1] Funding Source: UKRI
  8. Engineering and Physical Sciences Research Council [EP/L01162X/1] Funding Source: researchfish

Ask authors/readers for more resources

Mid-infrared absorption spectroscopy is highly relevant for a wide range of sensing applications. In this letter, we demonstrate a Fourier-transform spectrometer chip based on the principle of spatial heterodyning implemented in the silicon-on-insulator waveguide platform, and operating near 3.75-mu m wavelength. The spectrometer comprises a waveguide splitting tree feeding to an array of 42 Mach-Zehnder interferometers with linearly increasing optical path length differences. A spectral retrieval algorithm based on calibration matrices is applied to the stationary output pattern of the array, compensating for any phase and amplitude errors arising from fabrication imperfections. A spectral resolution below 3 nm is experimentally demonstrated.

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