Journal
APPLIED SPECTROSCOPY
Volume 76, Issue 5, Pages 590-598Publisher
SAGE PUBLICATIONS INC
DOI: 10.1177/00037028211068078
Keywords
Optical constants; extinction coefficient; refractive index; transmittance; analytical modeling; calcium fluoride; silicon
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Funding
- French National Research Agency [ANR-19-CE09-0013]
- Le Quy Don Technical University [20.1.028]
- Agence Nationale de la Recherche (ANR) [ANR-19-CE09-0013] Funding Source: Agence Nationale de la Recherche (ANR)
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In this paper, a new inverse analytical method is proposed to extract the optical parameters of a slab without the need for numerical iteration processes. The high accuracy of this method is evaluated by determining the optical parameters of CaF2 and Si substrates in the IR spectral range of 4-8 μm.
To date, determining with high accuracy the optical parameters (extinction coefficient k and refractive index n) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting (k, n) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF2 and Si substrates are determined in the IR spectral range of 4-8 mu m.
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