Journal
APPLIED PHYSICS LETTERS
Volume 119, Issue 18, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0069691
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Funding
- Czech Science Foundation [20-21864S]
- European Structural and Investment Funds
- Czech Ministry of Education, Youth, and Sports [SOLID21, CZ.02.1.01/0.0/0.0/16_019/0000760]
- Russian Science Foundation [21-12-00254]
- Russian Science Foundation [21-12-00254] Funding Source: Russian Science Foundation
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Ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)](N) multilayer films were studied using wideband spectroscopic ellipsometry, revealing that the surface metallic conductivity of the Bi layer is strongly influenced by the morphology and magnetic properties of the nanoisland FeNi layer.
Using wideband (0.5-6.5 eV) spectroscopic ellipsometry, we study ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)](N) multilayer films grown by rf sputtering deposition, where the FeNi layer has a nanoisland structure and its morphology and magnetic properties change with decreasing the nominal layer thickness. From multilayer model simulations of the ellipsometric angles, Psi( omega ) and Delta ( omega ), complex (pseudo)dielectric function spectra of the Bi layer were extracted. The obtained results demonstrate that the Bi layer can possess the surface metallic conductivity, which is strongly affected by the morphology and magnetic properties of the nanoisland FeNi layer in GMR-type Bi-FeNi multilayer structures.
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