Journal
APPLIED PHYSICS EXPRESS
Volume 14, Issue 12, Pages -Publisher
IOP Publishing Ltd
DOI: 10.35848/1882-0786/ac345e
Keywords
III-nitride semiconductors; resonant tunneling diodes; quantum transport; impurity scattering
Categories
Funding
- AFOSR [FA9550-20-1-0148]
- NSF RAISE TAQs [1 839 196]
- Semiconductor Research Corporation (SRC) Joint University Microelectronics Program (JUMP)
- NSF NewLaw [EFMA-1741694]
- ONR [N00014-20-1-2176, N00014-17-1-2414]
- NSF [DMR-1631282, ECCS-1542081, DMR-1719875]
Ask authors/readers for more resources
This study demonstrates the impact of collector doping setback on the quantum transport characteristics of GaN/AlN resonant tunneling diodes (RTDs), highlighting the importance of setback in preserving coherent injection and achieving higher peak-to-valley current ratios. The design results in consistently higher PVCRs, with a maximum PVCR = 2.01 obtained at cryogenic temperatures.
Harnessing resonant tunneling transport in III-nitride semiconductors to boost the operating frequencies of electronic and photonic devices, requires a thorough understanding of the mechanisms that limit coherent tunneling injection. Towards this goal, we present a concerted experimental and theoretical study that elucidates the impact of the collector doping setback on the quantum transport characteristics of GaN/AlN resonant tunneling diodes (RTDs). Employing our analytical model for polar RTDs, we quantify the width of the resonant-tunneling line shape, demonstrating that the setback helps preserve coherent injection. This design results in consistently higher peak-to-valley-current ratios (PVCRs), obtaining a maximum PVCR = 2.01 at cryogenic temperatures.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available