4.5 Article

Influence of collector doping setback in the quantum transport characteristics of GaN/AlN resonant tunneling diodes

Journal

APPLIED PHYSICS EXPRESS
Volume 14, Issue 12, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.35848/1882-0786/ac345e

Keywords

III-nitride semiconductors; resonant tunneling diodes; quantum transport; impurity scattering

Funding

  1. AFOSR [FA9550-20-1-0148]
  2. NSF RAISE TAQs [1 839 196]
  3. Semiconductor Research Corporation (SRC) Joint University Microelectronics Program (JUMP)
  4. NSF NewLaw [EFMA-1741694]
  5. ONR [N00014-20-1-2176, N00014-17-1-2414]
  6. NSF [DMR-1631282, ECCS-1542081, DMR-1719875]

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This study demonstrates the impact of collector doping setback on the quantum transport characteristics of GaN/AlN resonant tunneling diodes (RTDs), highlighting the importance of setback in preserving coherent injection and achieving higher peak-to-valley current ratios. The design results in consistently higher PVCRs, with a maximum PVCR = 2.01 obtained at cryogenic temperatures.
Harnessing resonant tunneling transport in III-nitride semiconductors to boost the operating frequencies of electronic and photonic devices, requires a thorough understanding of the mechanisms that limit coherent tunneling injection. Towards this goal, we present a concerted experimental and theoretical study that elucidates the impact of the collector doping setback on the quantum transport characteristics of GaN/AlN resonant tunneling diodes (RTDs). Employing our analytical model for polar RTDs, we quantify the width of the resonant-tunneling line shape, demonstrating that the setback helps preserve coherent injection. This design results in consistently higher peak-to-valley-current ratios (PVCRs), obtaining a maximum PVCR = 2.01 at cryogenic temperatures.

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