4.6 Article

1.7-kV and 0.55-mΩ . cm2 GaN p-n Diodes on Bulk GaN Substrates With Avalanche Capability

Journal

IEEE ELECTRON DEVICE LETTERS
Volume 37, Issue 2, Pages 161-164

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2015.2506638

Keywords

p-n junction diodes; high breakdown voltage; avalanche breakdown; specific on-resistance; ideality factor; bulk gallium nitride (GaN)

Funding

  1. ARPA-E SWITCHES Program

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We report vertical GaN-on-GaN p-n diodes with a breakdown voltage (BV) of 1.7 kV and a low differential specific ON-resistance R-ON of 0.55 m Omega . cm(2) with current spreading considered (or 0.4 m Omega . cm(2) using the diode bottom mesa size), resulting in a figure-of-merit (V-B(2)/R-ON) of 5.3 GW/cm(2) (or 7.2 GW/cm(2)). These devices exhibit a current swing over 14 orders of magnitude and a low ideality factor of 1.3. Temperature dependent I-V measurements show that the BV increases with increasing temperature, a signature of avalanche breakdown.

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