In situ micro-computed tomography to study microstructure and sublimation front during freeze-drying

In this study, a new method is presented to examine the freeze-drying process of frozen solutions in situ. By using a newly developed freeze-drying stage for high resolution micro-computed X-Ray tomography, the freeze-drying process can be investigated in more detail. For the proof of concept maltodextrin (c =0.05 w/w, c =0.2 w/w and c =0.3 w/w) and sucrose (c =0.2 w/w) solutions were used as model substances. The use of X-Ray radiography enables to analyze the drying kinetics, while X-Ray tomography describes the pore structure in more detail. The results are qualitatively compared and the proof of the concept will serve as a basis for further studies in the future.

Automated summary

A new method for examining the freeze-drying process of frozen solutions in situ was presented in this study, utilizing high resolution micro-computed X-Ray tomography. Maltodextrin and sucrose solutions were used as model substances for proof of concept. The results qualitatively compared drying kinetics using X-Ray radiography and pore structure using X-Ray tomography, providing a basis for future studies.