Analysis Strategies for MHz XPCS at the European XFEL

The nanometer length-scale holds precious information on several dynamical processes that develop from picoseconds to seconds. In the past decades, X-ray scattering techniques have been developed to probe the dynamics at such length-scales on either ultrafast (sub-nanosecond) or slow ((milli-)second) time scales. With the start of operation of the European XFEL, thanks to the MHz repetition rate of its X-ray pulses, even the intermediate mu s range have become accessible. Measuring dynamics on such fast timescales requires the development of new technologies such as the Adaptive Gain Integrating Pixel Detector (AGIPD). mu s-XPCS is a promising technique to answer many scientific questions regarding microscopic structural dynamics, especially for soft condensed matter systems. However, obtaining reliable results with complex detectors at free-electron laser facilities is challenging and requires more sophisticated analysis methods compared to experiments at storage rings. Here, we discuss challenges and possible solutions to perform XPCS experiments with the AGIPD at European XFEL; in particular, at the Materials Imaging and Dynamics (MID) instrument. We present our data analysis pipeline and benchmark the results obtained at the MID instrument with a well-known sample composed by silica nanoparticles dispersed in water.

Automated summary

The nanometer length-scale holds valuable information on dynamical processes that span from picoseconds to seconds. With the operation of XFEL and its high repetition rate X-ray pulses, even the intermediate microseconds range has become accessible. Conducting XPCS experiments with AGIPD at XFEL presents challenges due to the need for more sophisticated analysis methods.