Limitations of Structural Insight into Ultrafast Melting of Solid Materials with X-ray Diffraction Imaging

In this work, we analyze the application of X-ray diffraction imaging techniques to follow ultrafast structural transitions in solid materials using the example of an X-ray pump-X-ray probe experiment with a single-crystal silicon performed at a Linac Coherent Light Source. Due to the spatially non-uniform profile of the X-ray beam, the diffractive signal recorded in this experiment included contributions from crystal parts experiencing different fluences from the peak fluence down to zero. With our theoretical model, we could identify specific processes contributing to the silicon melting in those crystal regions, i.e., the non-thermal and thermal melting whose occurrences depended on the locally absorbed X-ray doses. We then constructed the total volume-integrated signal by summing up the coherent signal contributions (amplitudes) from the various crystal regions and found that this significantly differed from the signals obtained for a few selected uniform fluence values, including the peak fluence. This shows that the diffraction imaging signal obtained for a structurally damaged material after an impact of a non-uniform X-ray pump pulse cannot be always interpreted as the material's response to a pulse of a specific (e.g., peak) fluence as it is sometimes believed. This observation has to be taken into account in planning and interpreting future experiments investigating structural changes in materials with X-ray diffraction imaging.

Automated summary

This study analyzed the application of X-ray diffraction imaging techniques in following ultrafast structural transitions in solid materials. It was found that due to the spatially non-uniform profile of the X-ray beam, the diffraction signal recorded cannot always be interpreted as the material's response to a pulse of a specific fluence. This observation is crucial for planning and interpreting future experiments investigating structural changes in materials using X-ray diffraction imaging.