4.6 Article

High-Resolution, High-Contrast Optical Interface for Defect Qubits

Journal

ACS PHOTONICS
Volume 8, Issue 9, Pages 2642-2649

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsphotonics.1c00576

Keywords

point defects; microsphere-assisted microscopy; single photons; optically detected magnetic resonance; quantum sensing

Funding

  1. National Research Foundation of Korea (MSIT) [NRF-2019M3E4A1078664, NRF2020M3H3A1098869]
  2. Institute of Information and Communications Technology Planning and Evaluation (IITP) Grant [2019-0-00434]
  3. ITRC (Information Technology Research Center) support program [IITP-2021-2020-0-01606]
  4. KIST Institutional Program [2E3102121-032]
  5. GIST Research Institute(GRI) - GIST

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The study demonstrates high-resolution imaging of defects in diamonds using microsphere-assisted confocal microscopy, achieving improved spatial resolution and optical signal-to-noise ratio. This approach does not require complicated fabrication or additional optical systems, making it an efficient way to image and address closely spaced defects with better resolution and sensitivity.
Point defects in crystals provide important building blocks for quantum applications. Since we optically address these defect qubits, having an efficient optical interface is a highly important aspect. However, conventional confocal fluorescence microscopy of high-refractive-index crystals suffers from limited photon collection efficiency and spatial resolution. Here, we demonstrate high-resolution, high-contrast imaging of defects in diamonds using microsphere-assisted confocal microscopy. A microsphere provides an excellent optical interface for point defects with a magnified virtual image that increases the spatial resolution up to lambda/5, as well as the optical signal-to-noise ratio by four times. These features enable individual optical addressing of single photons and single spins of multiple defects that are spatially unresolved in conventional confocal microscopy, with improved signal contrast. Combined with optical tweezers, this system also demonstrates the possibility of positioning or scanning the microspheres. The approach does not require any complicated fabrication or additional optical systems, but uses simple, off-the-shelf micro-optics. From these distinctive advantages of microspheres, our approach provides an efficient way to image and address closely spaced defects with much better resolution and sensitivity.

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