Journal
JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY
Volume 55, Issue 3, Pages 197-218Publisher
TAYLOR & FRANCIS INC
DOI: 10.1080/08327823.2021.1952835
Keywords
Microwave absorption; device characterization; reflection coefficient; scattering parameters
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The common practice of applying reflection loss to material is incorrect, and a new theory of wave cancellation is proposed to explain experimental data on microwave absorption by composite films. Formulae for scattering parameters of the film have been derived based on the new theory, successfully differentiating microwave absorption mechanisms.
The common practice of applying reflection loss to material is incorrect as it can only be applied to film. Also the dominant theory of impedance matching should be replaced by wave cancellation theory. Here, we show that experimental data obtained from microwave absorption by the film of the titled composite can be successfully analyzed theoretically from our new theories. Formulae for the scattering parameters s(11) and s(21) of the film have been derived based on the wave addition model which clearly differentiates between microwave absorption mechanisms from interface and film. The experimental values, the patterns from s(11) and s(21), and the relationships between the patterns from the experimental values have been reproduced and interpreted both quantitatively and qualitatively from the new perspective. This specific new analysis for the verification of the new theory involving a large data set provides a clear indication that the conclusions obtained are not only valid for one unique system but are of general applicability. Thus, the new theory has been verified and can be used to reveal the mechanisms of microwave absorption by material and device. The successful interpretations are contrasted with the inadequacies of previous applied methods involving reflection loss and impedance matching.
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