Faceting-roughening transition of a Cu grain boundary under electron-beam irradiation at 300 keV

In this study, we examined the beam-irradiation effect on the structural evolution of the grain boundary (GB) in a Cu bicrystal at room temperature using a C-s-corrected, monochromated transmission electron microscope at an acceleration voltage of 300 keV. Faceting of the GB was observed at a low current density of the electron beam. With increasing current density, the GB became defaceted. The faceting-roughening transition was shown to be reversible, as the process was reversed upon decreasing the current density. The structural transition is explained by inelastic scattering effects by electron-beam irradiation.

Automated summary

This study investigated the structural evolution of the grain boundary in a Cu bicrystal at room temperature under beam-irradiation using a C-s-corrected, monochromated transmission electron microscope. The faceting of the grain boundary was observed at low current density but became defaceted at higher current density, with the transition being reversible upon decreasing the current density. The structural transition is attributed to inelastic scattering effects by electron-beam irradiation.