4.6 Article

The Al Doping Effect on Epitaxial (In,Mn)As Dilute Magnetic Semiconductors Prepared by Ion Implantation and Pulsed Laser Melting

Journal

MATERIALS
Volume 14, Issue 15, Pages -

Publisher

MDPI
DOI: 10.3390/ma14154138

Keywords

magnetic semiconductors; ion implantation; co-doping; magnetic properties

Funding

  1. Key-Area Research and Development Program of Guangdong Province [2019B121204004]
  2. National Natural Science Foundation of China (NSFC) [12074018]
  3. Basic and Application Basic Research Foundation of Guangdong Province [2020A1515110891]
  4. Ion Beam Center (IBC) at HZDR

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In this study, co-doping of (In,Mn)As diluted magnetic semiconductors by Al was conducted for the first time using co-implantation and pulsed laser annealing technique. The structural and magnetic properties were systematically investigated, showing a decrease in Curie temperature, magnetization, and uniaxial magnetic anisotropies with increased aluminum incorporation, possibly due to enhanced carrier localization or suppression of substitutional Mn atoms.
One of the most attractive characteristics of diluted ferromagnetic semiconductors is the possibility to modulate their electronic and ferromagnetic properties, coupled by itinerant holes through various means. A prominent example is the modification of Curie temperature and magnetic anisotropy by ion implantation and pulsed laser melting in III-V diluted magnetic semiconductors. In this study, to the best of our knowledge, we performed, for the first time, the co-doping of (In,Mn)As diluted magnetic semiconductors by Al by co-implantation subsequently combined with a pulsed laser annealing technique. Additionally, the structural and magnetic properties were systematically investigated by gradually raising the Al implantation fluence. Unexpectedly, under a well-preserved epitaxial structure, all samples presented weaken Curie temperature, magnetization, as well as uniaxial magnetic anisotropies when more aluminum was involved. Such a phenomenon is probably due to enhanced carrier localization introduced by Al or the suppression of substitutional Mn atoms.

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