Summary of ISO/TC 201 Technical Report 23173-Surface chemical analysis-Electron spectroscopies-Measurement of the thickness and composition of nanoparticle coatings

ISO Technical Report 23173 describes methods by which electron spectroscopies, including X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state-of-the-art for such measurements. Such analyses of core-shell nanoparticles are common within the literature, however the methods employed are varied; the relative advantages and disadvantages of these methods, and the optimal usage of each may not be clear to the general analyst. ISO Technical Report 23173 aims to clarify the methods that are available, describe them in clear terms, exhibit examples of their use, and highlight potential issues users may face. The information provided should allow analysts of electron spectroscopy data to make clear choices regarding the appropriate analysis of electron spectroscopy data from coated nanoparticle systems and provide a basis for understanding and comparing results from different methods and systems.

Automated summary

ISO Technical Report 23173 outlines methods for calculating coating thicknesses and compositions of nanoparticles using electron spectroscopies. It clarifies the relative advantages and disadvantages of different methods and aims to help analysts make clear choices when analyzing data from coated nanoparticle systems.