4.7 Article

High temperature aging of epoxy-based molding compound and its effect on mechanical behavior of molded electronic package

Journal

POLYMER DEGRADATION AND STABILITY
Volume 188, Issue -, Pages -

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.polymdegradstab.2021.109572

Keywords

Epoxy molding compound (EMC); Thermal aging; Oxidative degradation; Fluorescence microscopy; Elastic modulus; Coefficient of thermal expansion (CTE); Glass transition temperature; Thermomechanical behavior of package

Funding

  1. Federal Government of Germany [16ES0965]

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This study investigates the oxidation of epoxy-based molding compounds (EMC) under high temperature conditions, examining the oxidation growth process, critical thermomechanical properties of oxidized EMC, and the impact of oxidation on the thermomechanical behavior of electronic packaging. The results show that EMC oxidizes rapidly at high temperatures, forming an oxidized layer with distinct properties.
Epoxy-based molding compounds (EMC) are widely used to encapsulate automotive electronics. Under high temperature operation, EMC is oxidized and undergoes degradation in mechanical properties. This can alter the thermomechanical behavior of encapsulated electronic components, and thus can affect their reliability. Three key aspects of EMC oxidation in the context of microelectronics reliability are presented in this paper-(1) degradation of EMC specimens is studied under high temperature aging at three different temperatures - 170 degrees C, 200 degrees C, and 230 degrees C for up to 1500 hours and the oxidation growth is documented as a function of aging duration and temperature using a fluorescence microscope; (2) critical thermomechanical properties of oxidized EMC (viz., elastic modulus, thermal expansion coefficient, and glass transition temperature) are experimentally characterized using fully-oxidized specimens; (3) the effect of EMC oxidation on thermomechanical behavior of an electronic package is investigated by comparing the deformation of a thermally aged package with that of a pristine package under a thermal cycle. This study indicates that EMC oxidizes rapidly during early stages (approximate to 24 hours) of exposure to high temperature, and the oxidized layer exhibits significantly different thermomechanical properties. Thus, thermal aging develops a much stiffer package behavior, which is crucial for an accurate reliability assessment. (C) 2021 Elsevier Ltd. All rights reserved.

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