4.8 Article

Correlated Double-Electron Additions at the Edge of a Two-Dimensional Electronic System

Journal

PHYSICAL REVIEW LETTERS
Volume 126, Issue 25, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.126.256802

Keywords

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Funding

  1. Basic Energy Sciences Program of the Office of Science of the U.S. Department of Energy [FG02-08ER46514]
  2. Gordon and Betty Moore Foundation [GBMF2931]
  3. STC Center for Integrated Quantum Materials, National Science Foundation [DMR-1231319]
  4. National Science Foundation Graduate Research Fellowship [1122374]

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This research utilized laterally large and low-disorder GaAs quantum-well-based quantum dots to study tunneling of single electrons, identifying single-electron capacitance peaks in the addition spectrum. Two remarkable phenomena were observed in the Landau level filling factor range of nu = 2 to nu = 5: Coulomb blockade peaks due to the entrance of two electrons instead of one, and uniform appearance of double-height peaks at and near nu = 5/2 with a magnetic field flux periodicity of h/2e.
We create laterally large and low-disorder GaAs quantum-well-based quantum dots that act as small two-dimensional electron systems. We monitor tunneling of single electrons to the dots by means of capacitance measurements and identify single-electron capacitance peaks in the addition spectrum from occupancies of one up to thousands of electrons. The data show two remarkable phenomena in the Landau level filling factor range nu = 2 to nu = 5 in selective probing of the edge states of the dot: (i) Coulomb blockade peaks arise from the entrance of two electrons rather than one; (ii) at and near nu = 5/2 and at fixed gate voltage, these double-height peaks appear uniformly in a magnetic field with a flux periodicity of h/2e, but they group into pairs at other filling factors.

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