Journal
PHYSICA B-CONDENSED MATTER
Volume 612, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.physb.2020.412744
Keywords
Orbital occupation; Metal-insulator transition; Charge transfer; X-ray linear dichroism
Categories
Funding
- National Natural Science Foundation of China [52002107]
- Nature Science Foundation of Hebei Province [A2020201010]
- Opening Project of the State Key Laboratory of Electronic Thin Films and Integrated Devices [KFJJ201916]
- Science and Technology project of Hebei Education Department [QN2020156]
- China Postdoctoral Science Foundation [2020M670679]
- Postdoctoral Science Foundation of Hebei Province [B2020003018]
- Introduction of High-Level Talents Fund [521000981106, 521000981332]
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The tunable metal-insulator transitions (MIT) of ultrathin NdNiO3 (NNO) film grown on the LaAlO3/SrTiO3 two-dimensional electronic gas structures have been investigated through interfacial eg orbital reconstruction. Spectroscopy studies indicate that the polar catastrophe of the two-dimensional electronic gas leads to Ni2+ to Ni3+ charge transfer in NNO, facilitated by band-alignment conditions. The hybridization of Ni 3d and O 2p orbitals directly increases in-plane eg orbital occupancy, providing insight into the physical mechanism and modulation of the MIT.
Tunable metal-insulator transitions (MIT) of ultrathin NdNiO3 (NNO) film grown on the LaAlO3/SrTiO3 twodimensional electronic gas structures have been investigated by interfacial eg orbital reconstruction. Spectroscopy studies suggest that the polar catastrophe of the two-dimensional electronic gas results in Ni2+ to Ni3+ charge transfer of the NNO owing to the band-alignment condition. The orbital-hybridization of Ni 3d and O 2p can directly increase in-plane eg orbital occupancy, and the physical mechanism and modulation of the MIT can be clearly elucidated. This study not only provides new insight into the relationship between the electronic properties and orbital occupation, but it will also promote future application of epitaxial NNO thin films.
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