Journal
OPTICS LETTERS
Volume 46, Issue 15, Pages 3693-3696Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.426867
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Funding
- European Research Council [310005]
- Schweizerischer Nationalfonds zur Forderung der Wissenschaftlichen Forschung [159263, 206021_189662, CRSII2_154472, CRSII5_183568]
- Fondazione Gelu
- SwissLOS
- European Research Council (ERC) [310005] Funding Source: European Research Council (ERC)
- Swiss National Science Foundation (SNF) [CRSII5_183568, CRSII2_154472, 206021_189662] Funding Source: Swiss National Science Foundation (SNF)
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Fabricating fan-shaped G0 source gratings improves the imaging field of view in laboratory grating-based X-ray interferometry, enhancing both the uniformity and angular sensitivity.
The orientation mismatch between the cone beam of an X-ray tube and the grating lines in a flat substrate remains a big challenge for laboratory grating-based X-ray interferometry, since it severely limits the imaging field of view. Here, we fabricated fan-shaped Go source gratings by modulating the electric field during the deep reactive ion etching of silicon. The gold electroplated fan-shaped G(0) grating (3.0 mu m pitch) in a 20 keV interferometer improves the uniformity of the field of view with an increase of average visibility from 16.2% to 18.5% and a better angular sensitivity (by a factor 5.8) at the edges. (C) 2021 Optical Society of America
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