Journal
MATERIALS LETTERS
Volume 294, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.matlet.2021.129783
Keywords
GaN; Sputtered AlN; Epitaxial growth; MQWs; Luminescence
Funding
- Key Research and Development program in Shaanxi Province [2018ZDCXL-GY-01-02-02]
- National Natural Science Foundation of China [62074120]
- WuHu Research Institute of Xidian University [XWYCXY-012020007]
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The study investigated InGaN/GaN multiple quantum wells (MQWs) based light-emitting diode (LED) structures grown on silicon carbide (SiC) substrates with and without sputtered AlN nucleation layer (NL). Results showed that using sputtered AlN NL improved GaN crystalline quality, surface morphology, and luminescence property of the LED structures.
InGaN/GaN multiple quantum wells (MQWs) based light-emitting diode (LED) structures grown on silicon carbide (SiC) substrates with and without sputtered AlN nucleation layer (NL) were investigated. High resolution X-ray diffraction rocking curve results indicated an improvement of GaN crystalline quality by using sputtered AlN NL. The surface morphology improvement of the LED structures was characterized by atomic force microscope and the root-mean-square roughness decreased from 14.1 nm to 2.1 nm by using sputtered AlN NL. The obvious enhancement of luminescence property was identified by photoluminescence and cathode luminescence spectra. These results pave the way for potential applications in SiC based microwave power devices and light emitting devices. (C) 2021 Elsevier B.V. All rights reserved.
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