Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 33, Issue 48, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1361-648X/ac1dde
Keywords
two-dimensional material; blue phosphorene (BlueP); lateral structure; scanning tunneling hydrogen microscopy (STHM); electronic properties
Categories
Funding
- Deutsche Forschungsgemeinschaft (DFG) [FR 875/19-1]
- Studienstiftung des deutschen Volkes
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The growth of epitaxial BlueP on the Au(100) surface has been reported as an interesting alternative for quasi-freestanding BlueP domains. The two different phosphorus phases were observed using scanning tunneling microscopy and electron diffraction techniques. The lattice parameters and height modulation of the phosphorus atoms in the BlueP layers were found to closely resemble those of freestanding BlueP.
Blue phosphorene (BlueP) is a novel two-dimensional material that shares properties with black phosphorene and is potentially even more interesting for opto-electronic applications because of its layer dependent wide band gap of approximate to 2 to 3 eV and superior charge carrier mobility. It was first fabricated on Au(111), where, however, a network consisting of BlueP subunits and Au-linker atoms is formed. The physical properties of such an arrangement strongly differ from a freestanding BlueP monolayer. Here, we report on the growth of epitaxial BlueP on the Au(100) surface, which is an interesting alternative when aiming at quasi-freestanding BlueP domains. We find two different phosphorus phases by means of scanning tunneling microscopy and distortion-corrected low-energy electron diffraction. In the low coverage regime, we observe a commensurate (2 x 2) phase, whereas for higher coverage, a nearly hexagonal structure is formed. For the latter, the lattice parameters measured via atomically resolved scanning tunneling hydrogen microscopy closely resemble those of freestanding BlueP, and the typical height modulation of the phosphorus atoms is verified in our layers by means of x-ray photoelectron diffraction. We further analyze the chemical and electronic properties of these films by means of x-ray and (angle resolved) ultraviolet photoelectron spectroscopy.
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