4.6 Article

Exact Solution of Kinetic Analysis for Thermally Activated Delayed Fluorescence Materials

Journal

JOURNAL OF PHYSICAL CHEMISTRY A
Volume 125, Issue 36, Pages 8074-8089

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acs.jpca.1c04056

Keywords

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Funding

  1. EPSRC
  2. JSPS Core to Core grants (JSPS Core-to-Core Program) [EP/R035164/1]
  3. Program for Building Regional Innovation Ecosystems of the Ministry of Education, Culture, Sports, Science and Technology, Japan, JST ERATO [JPMJER1305]
  4. JSPS KAKENHI [JP20H05840]
  5. Kyulux Inc.
  6. EPSRC [EP/R035164/1] Funding Source: UKRI

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The photophysical analysis of TADF materials is crucial for understanding their stability and performance. A new method has been demonstrated in this report to determine rate constants without additional assumptions, providing a comprehensive understanding of the photophysics of diverse TADF emitters.
The photophysical analysis of thermally activated delayed fluorescence (TADF) materials has become instrumental for providing insights into their stability and performance, which is not only relevant for organic light-emitting diodes but also for other applications such as sensing, imaging, and photocatalysis. Thus, a deeper understanding of the photophysics underpinning the TADF mechanism is required to push materials design further. Previously reported analyses in the literature of the kinetics of the various processes occurring in a TADF material rely on several a priori assumptions to estimate the rate constants for forward and reverse intersystem crossing. In this report, we demonstrate a method to determine these rate constants using a threestate model together with a steady-state approximation and, importantly, no additional assumptions. Further, we derive the exact rate equations, greatly facilitating a comparison of the TADF properties of structurally diverse emitters and providing a comprehensive understanding of the photophysics of these systems.

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