4.5 Article

Research on Microstructure and Shear Behavior of Au/Sn-Ag-Cu/Cu Lead-free Solder Joints at Different Soldering Temperatures

Journal

JOURNAL OF ELECTRONIC MATERIALS
Volume 50, Issue 10, Pages 5965-5980

Publisher

SPRINGER
DOI: 10.1007/s11664-021-09107-z

Keywords

Flip-chip LED filament; void; shear strength; fracture shape; soldering temperature

Funding

  1. Shanghai Alliance Plan [LM201978]
  2. Science and Technology Planning Project of Zhejiang Province, China [2018C01046, J2016-141, J2017-171, J2017-293, J2017-243]

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This study investigates the influence of different soldering temperatures on the microstructure and shear behavior of flip-chip LED chips, indicating that solder joints exhibit high shear resistance at 270 degrees Celsius. As aging progresses, the shear strength initially increases and then decreases, with cracks and voids appearing as a result.
In the actual production process, soldering is a key step in the flip-chip packaging process. The reliability of the interconnection interface of flip-chip LED chips is considered to be one of the most important reliability issues. This paper studies the influence of different soldering temperatures on the microstructure and shear behavior of the Au/Sn-3.0Ag-0.5Cu/Cu solder joints of flip-chip LED chips. The lead-free solder Sn-3.0Ag-0.5Cu was selected as the solder. The microstructure of the intermetallic compound (IMC) interface and the inferred surface of the solder joint is observed, and the microstructure evolution of the solder joint is analyzed. The void ratio of the solder joints at 250 degrees C, 260 degrees C, 270 degrees C, 280 degrees C, and 290 degrees C soldering temperature was tested to characterize the influence of the contact area between the chip and the solder joint on the shear stress. In addition, the solder joints were aged for 1000 hours in an environment with a relative humidity of 85 degrees C/85%, and a shear test was performed to evaluate the influence of the interface reaction on the mechanical reliability of the solder joints during the isothermal aging process. The research show that when the soldering temperature is 270 degrees C, the Au on the bottom of the chip, and the solder and Cu on the substrate have fully reacted, and the solder joints have high shear resistance. The shear strength of the aging solder joints increases first and then decreases, because the high temperature repairs the defects in the solder layer caused by the low soldering temperature to a certain extent. With the extension of aging, cracks and voids gradually appear at the fracture interface, and the effective contact area decreases. The shear strength of the solder joint decreases, and the fracture mode becomes brittle.

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