Journal
JOURNAL OF APPLIED PHYSICS
Volume 130, Issue 5, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0056437
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Funding
- U.S. Department of Energy by Lawrence Livermore National Laboratory [DE-AC52-07NA27344]
- U.S. Department of Energy by Lawrence Livermore National Security, LLC [LLNL-JRNL-822329-DRAFT]
- U.S. Department of Energy's National Nuclear Security Administration [DE-NA0003525]
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The deformation of tantalum under extreme loading conditions was studied using experimental velocity data from Z-machine ramp loading experiments and gas gun compression experiments. Bayesian model calibration was used to infer physically motivated parameters, showing improvement over previous calibrations. Trade-offs between accuracy and transferability were revealed when examining Z-shots and gun-shots together and separately.
We study the deformation of tantalum under extreme loading conditions. Experimental velocity data are drawn from both ramp loading experiments on Sandia's Z-machine and gas gun compression experiments. The drive conditions enable the study of materials under pressures greater than 100 GPa. We provide a detailed forward model of the experiments including a model of the magnetic drive for the Z-machine. Utilizing these experiments, we simultaneously infer several different types of physically motivated parameters describing equation of state, plasticity, and anelasticity via the computational device of Bayesian model calibration. Characteristics of the resulting calculated posterior distributions illustrate relationships among the parameters of interest via the degree of cross correlation. The calibrated velocity traces display good agreement with the experiments up to experimental uncertainty as well as improvement over previous calibrations. Examining the Z-shots and gun-shots together and separately reveals a trade-off between accuracy and transferability across different experimental conditions. Implications for model calibration, limitations from model form, and suggestions for improvements are discussed. Published under an exclusive license by AIP Publishing.
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