4.5 Article

Modeling and Simulation of Monolithic Single-Supply Power Operational Amplifiers

Journal

ENERGIES
Volume 14, Issue 15, Pages -

Publisher

MDPI
DOI: 10.3390/en14154611

Keywords

analog circuits; amplifiers; power integrated circuits; integrated circuit modeling; PSpice; frequency-domain analysis

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This paper developed a simple PSpice macro-model to simulate the basic static and dynamic characteristics of monolithic power operational amplifiers operated with a single-supply voltage, with the accuracy of the model verified using the TDA2005 from ST Microelectronics. The simulation results were compared with experimental measurements, showing a relative error of less than 15% for the modeled large-signal parameters.
In this paper a simple PSpice (Personal Simulation Program with Integrated Circuit Emphasis) macro-model was developed, and verified for monolithic power operational amplifiers operated with a single-supply voltage. The proposed macro-model is developed using simplification and build-up techniques for macro-modeling of operational amplifiers and simulates the basic static and dynamic characteristics, including input impedance, small-signal frequency responses at various voltage gains, output power versus supply voltage, slew-rate-limiting, voltage limiting, output offset voltage versus supply voltage ripples, and output resistance. Furthermore, the macro-model also takes into account the ground reference voltage in the amplifier at a single power supply voltage. The model is implemented as a hierarchical structure suitable for the PSpice circuit simulation platform. The sub-circuit is built using standard PSpice components and analog behavioral modeling blocks. The accuracy of the model is verified by extracting the model parameters for single-supply power operational amplifier TDA2005 from ST Microelectronics as example. The effectiveness of the model is validated by comparing the simulation results of the electrical parameters with the corresponding measured values obtained by experimental testing of sample circuits. The comparative analysis shows that the relative error of the modeled large-signal parameters is less than 15%. Moreover, an error of 15% is quite acceptable, considering the technological tolerances of the electrical parameters for this type of analog ICs.

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