Journal
APPLIED PHYSICS LETTERS
Volume 118, Issue 24, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0051220
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Funding
- Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) [SFB1242, 278162697, RI_00313, HA 2769/7-1]
- Interdisciplinary Center for Analytics on the Nanoscale (ICAN) of the University of Duisburg-Essen
- Alexander von Humboldt Foundation
- Center of Excellence for Advanced Materials and Sensing Devices (ERDF) [K.01.1.1.01.0001]
- Deutsche Akademie der Naturforscher Leopoldina through a Leopoldina Postdoc Scholarship
- U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division
- Iowa State University [DE-AC02-07CH11358]
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Experimental results show a common origin of diffuse diffraction intensity in different atomically thin 2D-materials.
A broad, bell-shaped intensity component is observed in low-energy electron diffraction from high-quality epitaxial 2D-systems. Three 2D-systems, graphene on Ir(111), graphene on SiC(0001), and hexagonal boron nitride on Ir(111), have been prepared in situ under ultra-high vacuum conditions. In all three systems-independent of substrate material-similar strong diffuse intensity is observed, exhibiting a width as large as 50% of the Brillouin zone and an integrated intensity more than 10 times the intensity of the Bragg spots. The presented experimental results provide evidence for a common origin of such diffuse diffraction intensity in different atomically thin 2D-materials.
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