X-ray shielding behavior of TeO2-Li2O-GeO2-ZnO-Bi2O3 glass system using EPICS2017 library and Phy-X software

In the the present work, we discussed in detail the X-ray shielding behavior of the glasses in the composition of TeO2-Li2O-GeO2-ZnO-Bi2O3 for the energy range of 30.82-303 keV. Some essential radiation shielding parameters have effectively been evaluated via EPICS2017 library. EPICS2017 showed a relative change between 0.67%-8.23% from the Phy-X software mass attenuation coefficient (MAC) calculations. According to the findings, one can report that the linear attenuation coefficient (LAC) was enhanced for all photon energies owing to the insertion of 15 mol% Bi2O3. From these results, the authors evaluated the thickness variations by finding the half-value layer (HVL), and it was seen that BiTe1 was equal to 0.323 cm while BiTe2 to BiTe4 were equal to 0.221, 0.172, and 0.144 cm in the respective order, at 0.1606 MeV. Similarly, the tenth-value layer (TVL), mean free path (MFP), and effective atomic number (Z(eff)) were improved by far the best via sample-BiTe4 (highest Bi2O3 concentration).

Automated summary

In this study, the X-ray shielding behavior of glasses in the TeO2-Li2O-GeO2-ZnO-Bi2O3 composition was discussed in detail for the energy range of 30.82-303 keV. The results showed that the insertion of 15 mol% Bi2O3 enhanced the linear attenuation coefficient (LAC) for all photon energies. Samples with higher Bi2O3 concentrations, particularly BiTe4, exhibited the most significant improvements in tenth-value layer (TVL), mean free path (MFP), and effective atomic number (Z(eff)).