Journal
ANALYTICAL AND BIOANALYTICAL CHEMISTRY
Volume 413, Issue 22, Pages 5587-5600Publisher
SPRINGER HEIDELBERG
DOI: 10.1007/s00216-021-03452-y
Keywords
Electrospray ionization; Charged droplets detection; Droplet aspiration; Instrument contamination
Funding
- Projekt DEAL
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Charged droplets generated by electrospray ionization (ESI) can penetrate into the inlet system of atmospheric pressure ionization mass spectrometer (API-MS) as a general phenomenon observed in various instruments under common spray conditions.
Electrospray ionization (ESI) generates bare analyte ions from charged droplets, which result from spraying a liquid in a strong electric field. Experimental observations available in the literature suggest that at least a significant fraction of the initially generated droplets remain large, have long lifetimes, and can thus aspirate into the inlet system of an atmospheric pressure ionization mass spectrometer (API-MS). We report on the observation of fragment signatures from charged droplets penetrating deeply the vacuum stages of three commercial mass spectrometer systems with largely different ion source and spray configurations. Charged droplets can pass through the ion source and pressure reduction stages and even into the mass analyzer region. Since droplet signatures were found in all investigated instruments, the incorporation of charged droplets is considered a general phenomenon occurring with common spray conditions in ESI sources.
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