4.8 Article

Magnetoelectric Coupling at the Ni/Hf0.5Zr0.5O2 Interface

Journal

ACS NANO
Volume 15, Issue 9, Pages 14891-14902

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.1c05001

Keywords

ferroelectric HfO2; Hf0.5Zr0.5O2; composite multiferroics; magnetoelectric coupling; operando spectroscopy; XMCD; MCDAD

Funding

  1. Russian Science Foundation [18-12-00434]
  2. Ministry of Science and Higher Education of the Russian Federation [075-00337-20-03, FSMG-2020-0001]
  3. Russian Science Foundation [18-12-00434] Funding Source: Russian Science Foundation

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Composite multiferroics with ferroelectric and ferromagnetic components have larger magnetoelectric coupling compared to single-phase materials. Experimental evidence of charge-mediated magnetoelectric coupling at the Ni/Hf0.5Zr0.5O2 interface has been reported, showing the effect of ferroelectric polarization on the magnetic response of a nanometer-thick Ni layer. The results suggest promise in designing multifunctional devices compatible with modern semiconductor technology using ferroelectric HfO2-based composite multiferroics.
Composite multiferroics containing ferroelectric and ferromagnetic components often have much larger magnetoelectric coupling compared to their single-phase counterparts. Doped or alloyed HfO2-based ferroelectrics may serve as a promising component in composite multiferroic structures potentially feasible for technological applications. Recently, a strong charge-mediated magnetoelectric coupling at the Ni/HfO2 interface has been predicted using density functional theory calculations. Here, we report on the experimental evidence of such magnetoelectric coupling at the Ni/ Hf0.5Zr0.5O2(HZO) interface. Using a combination of operando XAS/XMCD and HAXPES/MCDAD techniques, we probe element-selectively the local magnetic properties at the Ni/HZO interface in functional Au/Co/Ni/HZO/W capacitors and demonstrate clear evidence of the ferroelectric polarization effect on the magnetic response of a nanometer-thick Ni marker layer. The observed magnetoelectric effect and the electronic band lineup of the Ni/HZO interface are interpreted based on the results of our theoretical modeling. It elucidates the critical role of an ultrathin NiO interlayer, which controls the sign of the magnetoelectric effect as well as provides a realistic band offset at the Ni/HZO interface, in agreement with the experiment. Our results hold promise for the use of ferroelectric HfO2-based composite multiferroics for the design of multifunctional devices compatible with modern semiconductor technology.

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