High-accuracy computation of hard X-ray focusing and imaging for refractive optics

A mathematical apparatus for solving problems of X-ray wave propagation through complex optical systems, when the lens thickness can change with jumps, is developed and presented. The developed method is based on the use of the superposition of oriented Gaussian beams, which satisfy the Helmholtz equation with high accuracy. The wave propagation in air and through kinoform and ordinary lenses is considered. Focusing and imaging properties are compared for both types of X-ray optics. The diffraction effects arising due to thickness jumps in the kinoform lenses and the influence of these jumps on the X-ray focusing and imaging are investigated. The prospect of using the developed theory for X-ray optics applications is discussed.

Automated summary

A mathematical approach for solving X-ray wave propagation problems through complex optical systems with varying lens thickness has been developed, focusing on the superposition of Gaussian beams satisfying the Helmholtz equation. The study compares focusing and imaging properties of X-ray optics and investigates diffraction effects and influences of thickness jumps on X-ray focusing and imaging in kinoform lenses. Discussions on the potential applications of the developed theory in X-ray optics are also included.