Journal
CRYSTALS
Volume 11, Issue 5, Pages -Publisher
MDPI
DOI: 10.3390/cryst11050504
Keywords
X-ray glitches; single-crystalline X-ray optics; diffraction losses
Funding
- Russian Scientific Foundation [19-72-30009]
- Russian Science Foundation [19-72-30009] Funding Source: Russian Science Foundation
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The study demonstrates a method to precisely determine the crystallographic orientation and unit cell parameters of optical elements from a small glitch spectrum, enabling the simulation of glitches for any energy.
X-ray optics made of single-crystal materials are widely used at most of the X-ray sources due to the outstanding properties. The main drawback of such optics-the diffraction losses, also known as glitches of intensity in the energy spectrum of the transmitted/diffracted beam. To be able to handle this negative effect, one needs a reliable way to simulate the glitch spectrum in any configuration. Here, we demonstrate the way of precisely determining the crystallographic orientation and unit cell parameters of optical elements just from a small glitch spectrum with the consequent possibility of simulating glitches for any energy.
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